By Electronic Device Failure Analysis Society.; International Symposium for Testing and Failure Analysis/2011.; ASM International
This quantity gains the newest examine and sensible facts from the top-rated occasion for the microelectronics failure research group. The papers conceal quite a lot of trying out and failure research issues of functional price to a person operating to discover, comprehend, and get rid of digital equipment and approach disasters. Case histories and evaluate papers are incorporated, in addition to courses to new and certain instruments and methodologies, purposes and effects
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Extra info for ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
The primary advantages of image-based MM measurements are that no additional external connection to the tester pins or power supply is required (aside from a trigger signal for probing), the data provides simultaneous measurements on multiple flops, the signal is linear in voltage, and if probing is necessary the images provide clear guidance on exactly where to probe[10, 11]. Software techniques for analyzing shift failures rely on capturing data from defective chains into defect-free chains and analyzing the output data from the good chains.
Then, we tried to address this defect with the most appropriate technique when dealing with soft defect, Dynamic Laser Stimulation (SDL). 20 At 10 MHz, there is something very interesting on this last acquisition, if we compared the DATA LVI signature of flip flop of interest; we clearly see a difference between FF 160 and FF 161. (see FF 161). Thanks to this acquisition we can conclude that the data signal of flip flop n° 161 is affected by the defect. Then, the natural following step is to complementarily use the Continuous Wave Laser Voltage Probing (Cw-LVP) versus LVI, to probe this interesting signal in order to explain the failure.
40-44.  J. Vickers, N. Pakdaman, and S. Kasapi, “Prospects of TimeResolved Photon Emission as a Debug Tool”, Symp. for Testing and Failure Analysis (ISTFA), 2002, pp. 645-653. B. , “Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications”, Int. Symp. for Testing and Failure Analysis (SIFA), 2002, pp. 741-746.  S. J. Weger, “Off-state luminescence in metaloxide-semiconductor field-effect transistors and its use as onchip voltage probe”, Appl. Phys.