Download e-book for kindle: ISTFA 2011 : conference proceedings from the 37th by Electronic Device Failure Analysis Society.; International

By Electronic Device Failure Analysis Society.; International Symposium for Testing and Failure Analysis/2011.; ASM International

This quantity gains the newest examine and sensible facts from the top-rated occasion for the microelectronics failure research group. The papers conceal quite a lot of trying out and failure research issues of functional price to a person operating to discover, comprehend, and get rid of digital equipment and approach disasters. Case histories and evaluate papers are incorporated, in addition to courses to new and certain instruments and methodologies, purposes and effects

Show description

Read or Download ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California PDF

Similar international_1 books

Stochastic Algorithms: Foundations and Applications: Third by Alexander Sapozhenko (auth.), Oleg B. Lupanov, Oktay M. PDF

This e-book constitutes the refereed court cases of the 3rd overseas Symposium on Stochastic Algorithms: Foundations and functions, SAGA 2005, held in Moscow, Russia in October 2005. The 14 revised complete papers awarded including five invited papers have been rigorously reviewed and chosen for inclusion within the booklet.

Algorithmic Game Theory: 7th International Symposium, SAGT by Ron Lavi PDF

This publication constitutes the refereed lawsuits of the seventh foreign Symposium on Algorithmic online game concept, SAGT 2014, held in Haifa, Israel, in October 2014. The 24 complete papers and five brief papers offered have been conscientiously reviewed and chosen from sixty five submissions. They conceal a variety of very important features of algorithmic online game idea, equivalent to matching conception, online game dynamics, video games of coordination, networks and social selection, markets and auctions, fee of anarchy, computational points of video games, mechanism layout and auctions.

Download e-book for iPad: Linking Local and Global Sustainability by Sukhbir Sandhu, Stephen McKenzie, Howard Harris

The ebook takes a holistic method of sustainability. Acknowledging the Brundtland definition, that sustainable improvement meets the desires of the current with out compromising the facility of destiny generations to satisfy their very own wishes, the ebook is particularly serious about the ethics of up to date social and environmental sustainability task and considering.

Extra info for ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

Example text

The primary advantages of image-based MM measurements are that no additional external connection to the tester pins or power supply is required (aside from a trigger signal for probing), the data provides simultaneous measurements on multiple flops, the signal is linear in voltage[9], and if probing is necessary the images provide clear guidance on exactly where to probe[10, 11]. Software techniques for analyzing shift failures rely on capturing data from defective chains into defect-free chains and analyzing the output data from the good chains[1].

Then, we tried to address this defect with the most appropriate technique when dealing with soft defect, Dynamic Laser Stimulation (SDL). 20 At 10 MHz, there is something very interesting on this last acquisition, if we compared the DATA LVI signature of flip flop of interest; we clearly see a difference between FF 160 and FF 161. (see FF 161). Thanks to this acquisition we can conclude that the data signal of flip flop n° 161 is affected by the defect. Then, the natural following step is to complementarily use the Continuous Wave Laser Voltage Probing (Cw-LVP) versus LVI, to probe this interesting signal in order to explain the failure.

40-44. [23] J. Vickers, N. Pakdaman, and S. Kasapi, “Prospects of TimeResolved Photon Emission as a Debug Tool”, Symp. for Testing and Failure Analysis (ISTFA), 2002, pp. 645-653. B. , “Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications”, Int. Symp. for Testing and Failure Analysis (SIFA), 2002, pp. 741-746. [10] S. J. Weger, “Off-state luminescence in metaloxide-semiconductor field-effect transistors and its use as onchip voltage probe”, Appl. Phys.

Download PDF sample

Rated 4.84 of 5 – based on 35 votes

About the Author

admin