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Additional resources for Microscopy of oxidation 2 : proceedings of the Second International Conference on the Microscopy of Oxidation, held at Selwyn College, University of Cambridge, 29-31 March 1993

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555 ";"e ~ 550 =:: :E en e ra 545 E ra c: 540 o 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 (microns) Fig. 4 Stress profile, derived from micro Raman data, of a-Cr203 scale formed on a 20Cr-25Ni-Nb steel, at high temperature. Experiments were de~isedll,12 in which polyurethane backed, polyvinylchloride sheet, was thermally degraded. The sheet was then sectioned and analysed by Raman MiFS. Figbure 5 is a MiFS profile of a resonance Raman band arising from the polyene degradation products across the sheet thickness.

H 12) 2 Microns Fig. 1 Profile through reference oxide formed on a steel. Using the Cameca IMS 3F and an argon primary beam, standard conditions have been established where the depth distribution of 10 elements is recorded using a sputtering rate of either 100 or 25 nm per minute, depending on the film thickness. A set of relative sensitivity factors was established using EPMA on thicker samples. An important feature of this approach was that only a 500/-LIDsquare. of the sample was affected so that samples could be replaced in the loop for further exposure.

The temperature is monitored by a Pt/Pt-lo%Rh thermocouple placed on the lower, back face of the specimen. There is a temperature difference between the upper and lower faces of the specimen and a calibration is carried out using pure metal standards of known melting point in order to establish the actual temperature of the viewed top face. The hot-stage has a temperature capability of l500°C, is controlled by a power unit capable of generating complex temperature cycles and it is possible to apply high linear heating rates of up to 100K min -1.

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